Double Phase Fault Collapsing with Linear Complexity in Digital Circuits

Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Josifovska, Galina; Oyeniran, Stephen Adeboye (2015). Double Phase Fault Collapsing with Linear Complexity in Digital Circuits. 18th Euromicro Conference on Digital Systems Design - DSD 2015 (1−6).. Funchal, Madeira, Portugal August 26-28, 2015: IEEE Computer Society Press.
kogumikuartikkel/peatükk raamatus/kogumikus
Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Josifovska, Galina; Oyeniran, Stephen Adeboye
18th Euromicro Conference on Digital Systems Design - DSD 2015
Funchal, Madeira, Portugal August 26-28, 2015
IEEE Computer Society Press
2015
16
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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