Temperature dependence of very deep emission from an exciton bound to an isoelectronic defect in polycrystalline CuInS2

Krustok, J.; Raudoja, J.; Jaaniso, R. (2006). Temperature dependence of very deep emission from an exciton bound to an isoelectronic defect in polycrystalline CuInS2. Applied Physics Letters, 89 (5), 051905.
ajakirjaartikkel
Krustok, J.; Raudoja, J.; Jaaniso, R.
  • Inglise
Applied Physics Letters
0003-6951
89
5
2006
051905
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
WOS

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