Near ambient pressure X-ray photoelectron - and impedance spectroscopy study of NiO - Ce0.9Gd0.1O2-δ anode reduction using a novel dual-chamber spectroelectrochemical cell

Nurk, G.; Kooser, K.; Urpelainen, S.; Käämbre, T.; Joost, U.; Kodu, M.; Kivi, I.; Kanarbik, R.; Kukk, E.; Lust, E. (2018).

Near ambient pressure X-ray photoelectron - and impedance spectroscopy study of NiO - Ce0.9Gd0.1O2-δ anode reduction using a novel dual-chamber spectroelectrochemical cell

. Journal of Power Sources, 378, 589−596.10.1016/j.jpowsour.2017.12.080.
ajakirjaartikkel
Nurk, G.; Kooser, K.; Urpelainen, S.; Käämbre, T.; Joost, U.; Kodu, M.; Kivi, I.; Kanarbik, R.; Kukk, E.; Lust, E.
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Near ambient pressure X-ray photoelectron - and impedance spectroscopy study of NiO - Ce0.9Gd0.1O2-δ anode reduction using a novel dual-chamber spectroelectrochemical cell

Near ambient pressure X-ray photoelectron - and impedance spectroscopy study of NiO - Ce0.9Gd0.1O2-δ anode reduction using a novel dual-chamber spectroelectrochemical cell

Journal of Power Sources
0378-7753
378
2018
589596
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
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doi.org/10.1016/j.jpowsour.2017.12.080

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