Measurement of mechanical and tribological properties of semiconducting nanowires inside scanning electron microscope

Vlassov, Sergei; Polyakov, Boris; Dorogin, Leonid; Antsov, Mikk; Kink, Ilmar; Lõhmus, Rünno (2012). Measurement of mechanical and tribological properties of semiconducting nanowires inside scanning electron microscope. UK Semiconductors 2012, Sheffield, UK.
publitseeritud konverentsiettekanne
Vlassov, Sergei; Polyakov, Boris; Dorogin, Leonid; Antsov, Mikk; Kink, Ilmar; Lõhmus, Rünno
  • Inglise
UK Semiconductors 2012, Sheffield, UK
2012
Ilmunud
5.2. Konverentsiteesid, mis ei kuulu valdkonda 5.1

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