Modeling of the impact of parameter spread on the switching performance of parallel-connected SiC VJFETs

Lim, J.-K.; Peftitsis, D.; Rabkowski, J.; Bakowski, M.; Nee, H.-P. (2013). Modeling of the impact of parameter spread on the switching performance of parallel-connected SiC VJFETs. Lebedev, AA; Davydov, SY; Ivanov, PA; Levinshtein, ME. SILICON CARBIDE AND RELATED MATERIALS 2012 (1098−1102).. Trans Tech Publications Ltd. (Materials Science Forum ).
kogumikuartikkel/peatükk raamatus/kogumikus
Lim, J.-K.; Peftitsis, D.; Rabkowski, J.; Bakowski, M.; Nee, H.-P.
Modeling of the impact of parameter spread on the switching performance of parallel-connected SiC VJFETs
SILICON CARBIDE AND RELATED MATERIALS 2012
Lebedev, AA; Davydov, SY; Ivanov, PA; Levinshtein, ME
Trans Tech Publications Ltd
740-742
Materials Science Forum
2013
10981102
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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