Marginal PCB Assembly Defect Detection on DDR3/4 Memory Bus

Odintsov, Sergei; Jutman, Artur; Devadze, Sergei (2017). Marginal PCB Assembly Defect Detection on DDR3/4 Memory Bus. Proc of 48th IEEE International Test Conference (ITC’2017): IEEE International Test Conference (ITC’2017). Fort Worth, TX, USA, Oct 31 - Nov 2: IEEE,.
publitseeritud konverentsiettekanne
Odintsov, Sergei; Jutman, Artur; Devadze, Sergei
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Proc of 48th IEEE International Test Conference (ITC’2017)
IEEE International Test Conference (ITC’2017)
Fort Worth, TX, USA, Oct 31 - Nov 2
IEEE
2017
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3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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