Effect of structure development on self-trapped exciton emission of TiO2 thin films

Sildos, I.; Suisalu, A.; Kiisk, V.; Schuisky, M.; Mändar, H.; Uustare, T.; Aarik, J. (2000). Effect of structure development on self-trapped exciton emission of TiO2 thin films. 4th International Conference on Thin Film Physics and Applications; Shanghai, China; 08.-11.05.2000. Ed. Chu, J.H.; Liu, P.; Chang, Y. Bellingham: SPIE, 427−430. (Proceedings of SPIE; 4086).10.1117/12.408489.
publitseeritud konverentsiettekanne
Sildos, I.; Suisalu, A.; Kiisk, V.; Schuisky, M.; Mändar, H.; Uustare, T.; Aarik, J.
  • Inglise
Chu, J.H.; Liu, P.; Chang, Y.
4th International Conference on Thin Film Physics and Applications; Shanghai, China; 08.-11.05.2000
Bellingham
SPIE
0277-786X
0819437298
Proceedings of SPIE
4086
2000
427430
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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dx.doi.org/10.1117/12.408489

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