Model based testing of distributed time critical systems

Vain, Jüri; Kanter, Gert; Srinivasan, Seshadhri (2017). Model based testing of distributed time critical systems. 2017 6th International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions) : September 20-22, 2017, Noida, India, [Proceedings]. Ed. Shukla, Balvinder; Khatri, Sunil Kumar; Kapur, P.K. Danvers, MA: IEEE, 99−105.10.1109/ICRITO.2017.8342406.
publitseeritud konverentsiettekanne
Vain, Jüri; Kanter, Gert; Srinivasan, Seshadhri
  • Inglise
2017 6th International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions) : September 20-22, 2017, Noida, India, [Proceedings]
Shukla, Balvinder; Khatri, Sunil Kumar; Kapur, P.K.
Danvers, MA
IEEE
978-1-5090-3012-5
2017
99105
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

Viited terviktekstile

doi.org/10.1109/ICRITO.2017.8342406