Parallel Pseudo-Exhaustive Testing of Array Multipliers with Data-Controlled Segmentation

Oyeniran, Adeboye Stephen; Payandeh Azad, Siavoosh; Ubar, Raimund; (2018). Parallel Pseudo-Exhaustive Testing of Array Multipliers with Data-Controlled Segmentation. International Symposium on Circuits and Systems (ISCAS). IEEE, 1−5.ISCAS.2018.8350936.
publitseeritud konverentsiettekanne
Oyeniran, Adeboye Stephen; Payandeh Azad, Siavoosh; Ubar, Raimund;
  • Inglise
International Symposium on Circuits and Systems (ISCAS)
IEEE
2379-447X
978-1-5386-4881-0
2018
15
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

Viited terviktekstile

10.1109/ISCAS.2018.8350936

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