Analysis of a Test Method for Delay Faults in NoC Interconnects

Bengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Ubar, Raimund; Peng, Zebo (2006). Analysis of a Test Method for Delay Faults in NoC Interconnects. Proc. of the IEEE East-West Design and Test Workshop (42−46).. Harkov University of Technology.
kogumikuartikkel/peatükk raamatus/kogumikus
Bengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Ubar, Raimund; Peng, Zebo
Proc. of the IEEE East-West Design and Test Workshop
Harkov University of Technology
2006
4246
Ilmunud
3.2. Artiklid/peatükid lisas mitte loetletud kirjastuste välja antud kogumikes

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