DefSim: Measurement Environment for CMOS Defects.

Borejko, T; Jutman, Artur; Pleskacz, Witold; Ubar, Raimund. (2006). DefSim: Measurement Environment for CMOS Defects. Proceedings of 25th International Conference on Microelectronics (MIEL’2006) (679−682).. Belgrade: IEEE Electron Devices Society.
kogumikuartikkel/peatükk raamatus/kogumikus
Borejko, T; Jutman, Artur; Pleskacz, Witold; Ubar, Raimund.
Proceedings of 25th International Conference on Microelectronics (MIEL’2006)
Belgrade
IEEE Electron Devices Society
2
2006
679682
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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